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Methodology for ensuring high reliability of VLSI systems

✍ Scribed by Byung-gi Kim; Hoon Chang; Jung Wan Cho

Book ID: 108495051
Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 737 KB
Volume: 43
Category: Article
ISSN: 1383-7621
DOI: 10.1016/s1383-7621(96)00092-6

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