Ensuring compactness, reliability, and scalability for the next generation of high-field lasers

✍ Scribed by Nees, J.; Biswas, S.; Droun, F.; Faure, J.; Nantel, M.; Mourou, G.A.; Nishimura, A.; Takuma, H.; Itatani, J.; Chanteloup, J.-C.; Honninger, C.

• Book ID: 117866162
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 139 KB
• Volume: 4
• Category: Article
• ISSN: 1077-260X
• DOI: 10.1109/2944.686745