๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Reliability analysis for VLSI electronic systems

โœ Scribed by Christopher M. Snowden; Roger D. Pollard; Patrick D.T. O'Connor

Publisher
Elsevier Science
Year
1986
Weight
303 KB
Volume
15
Category
Article
ISSN
0143-8174

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Reliability analysis for simple systems
Reliability analysis for simple systems
โœ A.V. Ferris-Prabhu; N.D. Lubart ๐Ÿ“‚ Article ๐Ÿ“… 1976 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 358 KB
A variation of transmission electron mic
A variation of transmission electron microscope sample preparation for VLSI analysis
โœ Madden, Michael C. ;Crafard, Penny ๐Ÿ“‚ Article ๐Ÿ“… 1989 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 593 KB

Sample preparation for VLSI analysis is often slow due to long ion milling time and because the location of the thin area of the sample is difficult to control. By modifying the standard techniques used with a VCR Group (and perhaps other) mechanical dimpler, the ion milling time can be reduced to l

Analysis and Simulation of Mixed-Technol
Analysis and Simulation of Mixed-Technology VLSI Systems
โœ Dale E. Martin; Radharamanan Radhakrishnan; Dhananjai M. Rao; Malolan Chetlur; K ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 282 KB

Circuit simulation has proven to be one of the most important computer aided design (CAD) methods for verification and analysis of, integrated circuit designs. A popular approach to modeling circuits for simulation purposes is to use a hardware description language such as VHDL. VHDL has had a treme