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Method for the diagonosis of a single intermittent fault in combinatorial logic circuits

✍ Scribed by Lala, P.K.; Missen, J.I.


Book ID
114445706
Publisher
Institution of Electrical Engineers
Year
1979
Weight
487 KB
Volume
2
Category
Article
ISSN
0140-1335

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A method of diagnosing single stuck-at f
✍ Teruhiko Yamada; Yoshiyuki Nakamura πŸ“‚ Article πŸ“… 1992 πŸ› John Wiley and Sons 🌐 English βš– 618 KB

## Abstract A new method is proposed to diagnose single stuck‐at faults in combinational circuits. In this method, based on the operations of the nonfaulty circuit, first the possible faulty paths are examined from the primary outputs, at which errors have been observed, toward the primary inputs t