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Method and apparatus for determination of the total directional emissivity of opaque materials in the temperature range 300 to 600 K

โœ Scribed by S. X. Cheng; S. X. Jing; X. S. Ge; C. C. Yao


Publisher
Springer
Year
1994
Tongue
English
Weight
387 KB
Volume
15
Category
Article
ISSN
0195-928X

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๐Ÿ“œ SIMILAR VOLUMES


An apparatus for measuring internal fric
โœ V.E. Miloshenki; I.V. Zolotukhin; V.S. Postnikov ๐Ÿ“‚ Article ๐Ÿ“… 1973 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 251 KB

We have designed and built an apparatus for measuring internal friction Q-1 (t) and electrical resistance of thin films and foils, of thickness 1 to 200 ~2, in the temperature range from 4.2 to 300 K.