An apparatus for measuring internal fric
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V.E. Miloshenki; I.V. Zolotukhin; V.S. Postnikov
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Article
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1973
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Elsevier Science
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English
⚖ 251 KB
We have designed and built an apparatus for measuring internal friction Q-1 (t) and electrical resistance of thin films and foils, of thickness 1 to 200 ~2, in the temperature range from 4.2 to 300 K.