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An apparatus for measuring internal friction of films during the process of plastic deformation in the temperature range from 4.2 to 300 K

โœ Scribed by V.S. Postnikov; N.A. Safonov; I.V. Zolotukhin; V.E. Miloshenko


Publisher
Elsevier Science
Year
1979
Tongue
English
Weight
247 KB
Volume
19
Category
Article
ISSN
0011-2275

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An apparatus for measuring internal fric
โœ V.E. Miloshenki; I.V. Zolotukhin; V.S. Postnikov ๐Ÿ“‚ Article ๐Ÿ“… 1973 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 251 KB

We have designed and built an apparatus for measuring internal friction Q-1 (t) and electrical resistance of thin films and foils, of thickness 1 to 200 ~2, in the temperature range from 4.2 to 300 K.