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Memristive characteristics in semiconductor/metal contacts tested by conductive atomic force microscopy

✍ Scribed by Wang, Wenhong; Dong, Ruixin; Yan, Xunling; Yang, Bing

Book ID: 121346613
Publisher: Institute of Physics
Year: 2011
Tongue: English
Weight: 617 KB
Volume: 44
Category: Article
ISSN: 0022-3727
DOI: 10.1088/0022-3727/44/47/475102

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