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[IEEE 2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Abu Dhabi (2013.3.26-2013.3.28)] 2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Electrical characteristics of graphene wrinkles extracted by conductive Atomic Force Microscopy and electrical measurements on kelvin structures

✍ Scribed by Alnemer, O.; Ally, H.; Alshehhi, A.; Saadat, M.; Souier, T.; Gougam, A. B.; Nayfeh, H.

Book ID: 125815289
Publisher: IEEE
Year: 2013
Weight: 879 KB
Category: Article
ISBN: 1467360384
DOI: 10.1109/DTIS.2013.6527806

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