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[IEEE 2004 International Semiconductor Conference. CAS 2004 - Sinaia, Romania (4-6 Oct. 2004)] 2004 International Semiconductor Conference. CAS 2004 Proceedings (IEEE Cat. No.04TH8748) - Surface characteristics of In and Zn oxides by atomic force microscopy

✍ Scribed by Suchea, M.; Kiriakidis, G.

Book ID: 118235525
Publisher: IEEE
Year: 2004
Weight: 270 KB
Volume: 2
Category: Article
ISBN-13: 9780780384996
DOI: 10.1109/smicnd.2004.1403012

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