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[IEEE 2004 International Semiconductor Conference. CAS 2004 - Sinaia, Romania (4-6 Oct. 2004)] 2004 International Semiconductor Conference. CAS 2004 Proceedings (IEEE Cat. No.04TH8748) - MOSFET process optimization and characteristics extraction

✍ Scribed by Babarada, F.; Lakatos, E.; Profirescu, M.D.; Amza, C.; Manea, E.; Dumbravescu, N.; Profirescu, M.D.

Book ID: 127154984
Publisher: IEEE
Year: 2004
Weight: 273 KB
Volume: 2
Category: Article
ISBN-13: 9780780384996
DOI: 10.1109/smicnd.2004.1403004

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