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Melting and solidification behavior of laser-crystallized silicon thin-films studied by transient conductance measurements

✍ Scribed by M. Weizman; C. Klimm; N.H. Nickel; B. Rech

Book ID: 119301132
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 252 KB
Volume: 358
Category: Article
ISSN: 0022-3093
DOI: 10.1016/j.jnoncrysol.2012.01.036

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