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SPIE Proceedings [SPIE 2012 International Workshop on Information Data Storage and Ninth International Symposium on Optical Storage - Shanghai, China (Sunday 21 October 2012)] 2012 International Workshop on Information Storage and Ninth International Symposium on Optical Storage - Real-time measurement of electrical and optical transients of as-deposited amorphous AgInSbTe thin films during crystallization induced by single-shot picosecond laser pulses

✍ Scribed by Liang, G. F.; Li, S. M.; Huang, H.; Zhai, F. X.; Wang, Y.; Lai, T. S.; Wu, Y. Q.; Gan, Fuxi; Song, Zhitang

Book ID: 121353638
Publisher: SPIE
Year: 2013
Weight: 611 KB
Volume: 8782
Category: Article
DOI: 10.1117/12.2014860

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