High depth resolution analysis of CuSi(1
High depth resolution analysis of CuSi(111) โ5 ร 5โ structure with medium energy ion scattering
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K. Yamashita; T. Yasue; T. Koshikawa; A. Ikeda; Y. Kido
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Article
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1998
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Elsevier Science
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English
โ 531 KB