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Medium energy ion scattering study of Ni on ultrathin films of SiO2 on Si(111)

โœ Scribed by J.B. Zhou; T. Gustafsson; R.F. Lin; E. Garfunkel


Publisher
Elsevier Science
Year
1993
Weight
75 KB
Volume
284
Category
Article
ISSN
0167-2584

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