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Medium energy ion scattering study of Ni on ultrathin films of SiO2 on Si(111)

✍ Scribed by J.B. Zhou; T. Gustafsson; R.F. Lin; E. Garfunkel

Book ID: 118366110
Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 1014 KB
Volume: 284
Category: Article
ISSN: 0039-6028
DOI: 10.1016/0039-6028(93)90525-o

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