𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Measuring the Thickness of the Liquid-like Layer on Ice Surfaces with Atomic Force Microscopy

✍ Scribed by Döppenschmidt, Astrid; Butt, Hans-Jürgen

Book ID
121309722
Publisher
American Chemical Society
Year
2000
Tongue
English
Weight
109 KB
Volume
16
Category
Article
ISSN
0743-7463

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Measuring the relative interface thickne
Measuring the relative interface thickness of multilayer polyolefin films with atomic force microscopy
✍ Rajesh P. Paradkar; Jing Li; Georg Bar; Hoang Pham; Clive Bosnyak; Jeffrey Weinh 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 838 KB

## Abstract In any polymer blend system, the nature and thickness of the polymer interface can have a significant influence on the overall performance of the blend. Consequently, it is important to understand the nature of the interactions between the various blend components to effectively design

Study of the influence of native oxide l
Study of the influence of native oxide layers on atomic force microscopy imaging of semiconductor surfaces
✍ H. Bluhm; U. D. Schwarz; F. Herrmann; P. Paufler 📂 Article 📅 1994 🏛 Springer 🌐 English ⚖ 757 KB

We have investigated the influence of the native oxide layer on semiconductor surfaces on the imaging properties of the atomic force microscope operated under ambient conditions by using epitaxial Inl\_xGaxAs layers grown by Metal-Organic Chemical Vapour Deposition (MOCVD) on (001) oriented InP subs