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Measuring the thickness of dead layers in semiconductor detectors

✍ Scribed by Yu. B. Gurov; S. V. Isakov; V. S. Karpukhin; S. V. Lapushkin; V. G. Sandukovsky; B. A. Chernyshev


Book ID
110167513
Publisher
Springer
Year
2008
Tongue
English
Weight
172 KB
Volume
51
Category
Article
ISSN
0020-4412

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