The absorption edges in the background of an electron excited x-ray spectrum recorded by an Si(Li) detector with a polymer window are used to determine the thicknesses of front contact and dead layers, and also those of absorbing hydrocarbon and ice layers. A careful sample preparation is necessary
β¦ LIBER β¦
Determination of gold-layer and dead-layer thicknesses for a Si(Li) detector
β Scribed by R.G. Musket; W. Bauer
- Publisher
- Elsevier Science
- Year
- 1973
- Weight
- 173 KB
- Volume
- 109
- Category
- Article
- ISSN
- 0029-554X
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