An experimental method to evaluate the dead Layer thickness of X- and gamma-ray semiconductor detectors

✍ Scribed by Dusi, W.; Donati, A.; Landini, G.; Perillo, E.; Raulo, A.; Ventura, G.; Vitulli, S.

• Book ID: 120532273
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 308 KB
• Volume: 51
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2004.839098