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Measuring anisotropic refractive indices and film thicknesses of thin organic crystals using the prism coupling method

✍ Scribed by Zhang, Gongjian ;Sasaki, Keisuke


Book ID
115339306
Publisher
The Optical Society
Year
1988
Tongue
English
Weight
518 KB
Volume
27
Category
Article
ISSN
1559-128X

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## Abstract An efficient method for measuring the parameters of anisotropic slab waveguides is presented in this paper. This method can be used to measure the parameters of single‐mode anisotropic slab waveguides. The measured results show that the errors of the refractive indices are within 4.2 Γ—