Plasma silicon oxide films on garnet substrates: measurement of their thickness and refractive index by the prism coupling technique

✍ Scribed by Hou, T. W. ;Mogab, C. J.

• Book ID: 115329272
• Publisher: The Optical Society
• Year: 1981
• Tongue: English
• Weight: 657 KB
• Volume: 20
• Category: Article
• ISSN: 1559-128X
• DOI: 10.1364/AO.20.003184