✦ LIBER ✦

Laser coupling: A new technique for measurement of refractive index and thickness of oxide and nitride films on silicon

✍ Scribed by Schinke, D.; Smith, R.; Karr, M.; Mackenzie, D.

Book ID: 119794011
Publisher: IEEE
Year: 1977
Tongue: English
Weight: 712 KB
Volume: 13
Category: Article
ISSN: 0018-9197
DOI: 10.1109/jqe.1977.1069622

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