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Measurements and modeling of MOSFET I-V characteristics with polysilicon depletion effect

✍ Scribed by Cheng-Linag Huang; Arora, N.D.

Book ID: 114535478
Publisher: IEEE
Year: 1993
Tongue: English
Weight: 788 KB
Volume: 40
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.249483

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