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Measurement of thermal conductivity of silicon dioxide thin films using a 3ω method

✍ Scribed by Yamane, Tsuneyuki; Nagai, Naoto; Katayama, Shin-ichiro; Todoki, Minoru


Book ID
119953911
Publisher
American Institute of Physics
Year
2002
Tongue
English
Weight
341 KB
Volume
91
Category
Article
ISSN
0021-8979

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