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Measurement of the parameters of nanometer films by optical and microwave methods

✍ Scribed by D. A. Usanov; Al. V. Skripal’; An. V. Skripal’; A. V. Abramov; A. S. Bogolyubov; Ali Bakouei

Book ID
111445123
Publisher
Springer
Year
2011
Tongue
English
Weight
202 KB
Volume
45
Category
Article
ISSN
1063-7826

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The refractive index n f , extinction coecient k f and thickness d f of a dip coated ®lm are measured by using p-polarized laser beams. A sample is oblique illuminated with a p-polarized laser beam, and then two re¯ected beams, from the front and back surfaces, are received with a detector. After me