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Measurement of the Minority Carrier Diffusion Length in Thin Wafers of Semiconductor Crystals

โœ Scribed by I. A. Bolesov; V. P. Astakhov; V. V. Karpov


Book ID
110438498
Publisher
Springer
Year
2003
Tongue
English
Weight
28 KB
Volume
46
Category
Article
ISSN
0020-4412

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