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Measurement of the minority-carrier diffusion length in thin semiconductor films

โœ Scribed by Ching-Lang Chiang; Schwarz, R.; Slobodin, D.E.; Kolodzey, J.; Wagner, S.


Book ID
114595706
Publisher
IEEE
Year
1986
Tongue
English
Weight
702 KB
Volume
33
Category
Article
ISSN
0018-9383

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