Measurement of minority carrier diffusion length from spectral response of thin film polycrystalline silicon solar cells

✍ Scribed by R. Kishore; M. Barbe; J.L. Pastol; M. Caymax; J.E. Bouree; G. Revel; M. Rodot

• Publisher: Elsevier Science
• Year: 1988
• Weight: 692 KB
• Volume: 25
• Category: Article
• ISSN: 0379-6787
• DOI: 10.1016/0379-6787(88)90052-x