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Measurement of the evanescent field using noncontact mode atomic force microscope

โœ Scribed by Masayuki Abe; Takayuki Uchihashi; Masahiro Ohta; Hitoshi Ueyama; Yasuhiro Sugawara; Seizo Morita


Publisher
Optical Society of Japan
Year
1997
Tongue
English
Weight
470 KB
Volume
4
Category
Article
ISSN
1340-6000

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