A new external electro-optic probing technology has been first demonstrated using a poling electro-optic (EO) polymer film, spincoated on 20 nm thick grounding perspective aluminum layer which sputtered on a piece of ITO glass รฐ1000 mm ร 1000 mm ร 80 mmร as a probe tip, the aluminum layer which has
โฆ LIBER โฆ
Measurement of the electro-optic coefficient of polymer thin films with better spatial resolution
โ Scribed by Alin Hou; Hongfei Liu; Jie Sun; Daming Zhang; Maobin Yi
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 176 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0030-3992
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Electro-optic measurement system with hi
โ
Hongfei Liu; Maobin Yi; Hongbo Zhang; Alin Hou; Xiaohong Chuai; Daming Zhang
๐
Article
๐
2005
๐
Elsevier Science
๐
English
โ 279 KB
The measurement of the electrical field
โ
Hailan Li; Zhanguo Chen; Gang Jia; Xiaoting Zhang; Yanchen Li
๐
Article
๐
2004
๐
Elsevier Science
๐
English
โ 266 KB
Simultaneous measurement of resistivity
โ
Silas E. Gustafsson; Ernest Karawacki; M. Naushad Khan
๐
Article
๐
1982
๐
Elsevier Science
๐
English
โ 366 KB
Thickness Measurements of Thin Perfluoro
โ
Michael F. Toney; C.Mathew Mate; K.Amanda Leach; Daryl Pocker
๐
Article
๐
2000
๐
Elsevier Science
๐
English
โ 111 KB
Experimental techniques used to measure structural parameters of thin films such as thickness, density, and coverage provide important insights into the physical properties of these films. Structural parameters are also often used to predict the eventual performance of thin films. In this study, we
Ablation of thin polymer films on Si or
โ
Matthias Bolle; Sylvain Lazare
๐
Article
๐
1992
๐
Elsevier Science
๐
English
โ 392 KB
A method for the measurement of thin fil
โ
R. Brendel; R. Ziegler; R. Hezel
๐
Article
๐
1991
๐
Elsevier Science
๐
English
โ 665 KB