✦ LIBER ✦

Measurement of source and drain series resistances of HIGFETs using a bias-scan method

✍ Scribed by C.C. Sun; J.M. Xu; A. Hagley; R. Surridge; A. SpringThorpe

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

On the extraction of the source and drai

✍ F.J. Garcı́a Sánchez; A. Ortiz-Conde; J.J. Liou 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 230 KB

Experimental application of a novel tech

✍ Roberto Menozzi; Paolo Cova; Luca Selmi 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 191 KB

Determination of gate-bias dependent sou

✍ C.S. Ho; Y.C. Lo; Y.H. Chang; Juin J. Liou 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 233 KB

The IAEA Proficiency Test on Evaluation

✍ P. De Regge; Z. Radecki; J. Moreno; K. Burns; G. Kis-Benedek; R. Bojanowski 📂 Article 📅 2000 🏛 Springer 🌐 English ⚖ 490 KB

A novel method of suppressing the inrush

✍ Hiroaki Yamada; Toshihiko Tanaka; Shigeyuki Funabiki 📂 Article 📅 2006 🏛 John Wiley and Sons 🌐 English ⚖ 662 KB

Melting and crystallization behavior of

✍ Takeshi Suwa; Masaaki Takehisa; Sueo Machi 📂 Article 📅 1973 🏛 John Wiley and Sons 🌐 English ⚖ 229 KB 👁 2 views