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Measurement of soft X-ray radiation using the PF-4 plasma focus setup with semiconductor X-ray detectors

โœ Scribed by S. P. Eliseev; V. Ya. Nikulin; P. V. Silin


Book ID
111505300
Publisher
Allerton Press, Inc.
Year
2009
Tongue
English
Weight
493 KB
Volume
36
Category
Article
ISSN
1068-3356

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Characterization of spatial homogeneity
โœ P.N. Aruev; Yu.M. Kolokolnikov; N.V. Kovalenko; A.A. Legkodymov; V.V. Lyakh; A.D ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 379 KB

We at Siberian Synchrotron Radiation Center (Novosibirsk) have conducted comparative studies of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors SPD-100UV developed by the Physical Technical Institute (St. Petersburg) as well as AXUV-100 (made by IRD Inc., USA).