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Preliminary characterization of semiconductor detectors in the soft X-ray range using synchrotron radiation from the VEPP-4 storage ring

✍ Scribed by P. N. Aruev; Yu. M. Kolokolnikov; N. V. Kovalenko; A. A. Legkodymov; V. V. Lyakh; A. D. Nikolenko; V. F. Pindyurin; V. L. Sukhanov; V. V. Zabrodsky

Book ID
110203189
Publisher
Pleiades Publishing
Year
2010
Tongue
English
Weight
270 KB
Volume
4
Category
Article
ISSN
1027-4510

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✍ P.N. Aruev; Yu.M. Kolokolnikov; N.V. Kovalenko; A.A. Legkodymov; V.V. Lyakh; A.D πŸ“‚ Article πŸ“… 2009 πŸ› Elsevier Science 🌐 English βš– 379 KB

We at Siberian Synchrotron Radiation Center (Novosibirsk) have conducted comparative studies of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors SPD-100UV developed by the Physical Technical Institute (St. Petersburg) as well as AXUV-100 (made by IRD Inc., USA).