Characterization of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors in the soft X-ray range

✍ Scribed by P.N. Aruev; Yu.M. Kolokolnikov; N.V. Kovalenko; A.A. Legkodymov; V.V. Lyakh; A.D. Nikolenko; V.F. Pindyurin; V.L. Sukhanov; V.V. Zabrodsky

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 379 KB
• Volume: 603
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2008.12.159

✦ Synopsis

We at Siberian Synchrotron Radiation Center (Novosibirsk) have conducted comparative studies of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors SPD-100UV developed by the Physical Technical Institute (St. Petersburg) as well as AXUV-100 (made by IRD Inc., USA). These works were carried out at the ''Cosmos'' station on the VEPP-4 storage ring in the soft X-ray range (80-1000 eV).