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Measurement of small diffusion coefficients using ion-beam-sputtering as a microsectioning technique

✍ Scribed by H. Mehrer; K. Maier; G. Hettich; H.J. Mayer; G. Rein

Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 378 KB
Volume: 69-70
Category: Article
ISSN: 0022-3115
DOI: 10.1016/0022-3115(78)90269-6

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