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Measurement of Residual Stress in Thin-Sized Steel Wires by Using Focused Ion Beam and Digital Image Correlation Method

✍ Scribed by Yang, Yo Sep; Bae, Jong Gu; Park, Chan Gyung

Book ID: 120435736
Publisher: Trans Tech Publications, Ltd.
Year: 2007
Tongue: English
Weight: 765 KB
Volume: 26-28
Category: Article
ISSN: 1662-8958
DOI: 10.4028/www.scientific.net/AMR.26-28.1187

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