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Measurement of poisson’s ratio of a thin film on a substrate by combining x-ray diffraction within situsubstrate bending

✍ Scribed by Ho-Young Lee; Su-Jeong Suh; Sung-Ryong Kim; Se-Young Park; Young-Chang Joo

Book ID: 111857024
Publisher: The Korean Institute of Metals and Materials
Year: 2009
Tongue: English
Weight: 205 KB
Volume: 5
Category: Article
ISSN: 1738-8090
DOI: 10.3365/eml.2009.03.051

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