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Measurement of complex dielectric permittivity of partially inserted samples in a cavity perturbation technique

✍ Scribed by Subramanian, V.; Sivasubramanian, V.; Murthy, V. R. K.; Sobhanadri, J.

Book ID: 120063132
Publisher: American Institute of Physics
Year: 1996
Tongue: English
Weight: 720 KB
Volume: 67
Category: Article
ISSN: 0034-6748
DOI: 10.1063/1.1146548

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## Abstract A new approach to measure the complex dielectric permittivity of materials placed inside a microwave resonant cavity is presented. We exploit the similarity between the microwave cavity and an optical cavity to develop a new measurement technique, which is used to obtain the complex per