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Extended cavity perturbation technique to determine the complex permittivity of dielectric materials

✍ Scribed by Binshen Meng; Booske, J.; Cooper, R.

Book ID
114552569
Publisher
IEEE
Year
1995
Tongue
English
Weight
464 KB
Volume
43
Category
Article
ISSN
0018-9480

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Application of the FDTD method to determ
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## Abstract A new measurement technique is presented to determine the complex permittivity of a dielectric material. The dielectric sample is loaded in a short‐circuited rectangular waveguide. The reflection coefficient of the waveguide is measured by Network analyzer and calculated as a function o