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New microwave system to determine the complex permittivity of small dielectric and semiconducting samples

✍ Scribed by J. Musil; F. Žáček; A. Bürger; J. Karlovský

Book ID
112567311
Publisher
Springer
Year
1975
Tongue
English
Weight
610 KB
Volume
25
Category
Article
ISSN
0011-4626

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Application of the FDTD method to determ
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## Abstract A new measurement technique is presented to determine the complex permittivity of a dielectric material. The dielectric sample is loaded in a short‐circuited rectangular waveguide. The reflection coefficient of the waveguide is measured by Network analyzer and calculated as a function o