Measurement of dielectric parameters of small samples at X-band frequencies by cavity perturbation technique

✍ Scribed by Verma, A.; Dube, D.C.

• Book ID: 114629993
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 243 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2005.854249