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Measurements of dielectric properties of TiO2thin films at microwave frequencies using an extended cavity perturbation technique

✍ Scribed by Jyh Sheen; Chueh-Yu Li; Liang-Wen Ji; Wei-Lung Mao; Weihsing Liu; Chin-An Chen

Book ID
106398498
Publisher
Springer US
Year
2009
Tongue
English
Weight
452 KB
Volume
21
Category
Article
ISSN
0957-4522

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## Abstract Dielectric properties of strontium sodium niobate ceramics at the __S__ band of microwave frequencies are studied using a network analyzer. The microwave cavity perturbation technique is employed for this study. Dielectric parameters such as complex permittivity and conductivity of stro