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Measurement method for accurate extraction of the base-to-emitter intrinsic and peripheral capacitances of bipolar transistors

✍ Scribed by Chih Hsin Wang

Book ID: 114536331
Publisher: IEEE
Year: 1995
Tongue: English
Weight: 674 KB
Volume: 42
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.469404

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