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[IEEE 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting 2000 - Minneapolis, MN, USA (24-26 Sept. 2000)] Proceedings of the 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.00CH37124) - Extraction of the base-collector capacitance splitting along the base resistance using HF measurements [bipolar transistors]

✍ Scribed by Berger, D.; Gambetta, N.; Celi, D.; Dufaza, C.

Book ID: 120166049
Publisher: IEEE
Year: 2000
Weight: 311 KB
Category: Article
ISBN-13: 9780780363847
DOI: 10.1109/BIPOL.2000.886199

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