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[IEEE 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting 2000 - Minneapolis, MN, USA (24-26 Sept. 2000)] Proceedings of the 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.00CH37124) - Transistor noise in SiGe HBT RF technology

โœ Scribed by Guofu Niu, ; Cressler, J.D.; Zhenrong Jin, ; Shiming Zhang, ; Juraver, J.B.; Borgarino, M.; Plana, R.; Llopis, O.; Webster, C.; Joseph, A.J.


Book ID
120034434
Publisher
IEEE
Year
2000
Weight
377 KB
Category
Article
ISBN-13
9780780363847

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โœ Ahlgren, D.C.; Freeman, G.; Subbanna, S.; Groves, R.; Greenberg, D.; Malinowski, ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› IEEE ๐ŸŒ English โš– 244 KB

This Text On Bipolar And Bicmos Circuits And Technology Covers: Design; Performance; Fabrication; Testing; Application; Integrated Circuits; Phenomena; Discrete Devices; Radio Frequency Design; Innovative Packaging; Device Physics, Modelling And Simulation; Cad Tools; And Power Devices And Ics.