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Maxima of the spectral reflectance ratio of polarized waves used to measure the thickness of a nonabsorbing thin film

✍ Scribed by P. Hlubina; J. Luňáček; D. Ciprian

Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
602 KB
Volume
48
Category
Article
ISSN
0143-8166

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## Abstract The fabrication and unique characteristics of a new type of thin layer electrode, an optically reflective thin layer electrode (ORTLE), are described. The electrode was fabricated by the anodization of a thin layer of aluminum sputtered onto a plain glass microscope slide to create a 75