โ Scribed by A. Jablonski; B. Lesiak; H. Ebel; Maria F. Ebel
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Elastic electron scattering in XPS and AES vary considerably with depth of origin of emitted electrons. To account for this, we introduced in a recent paper a simple correction factor CF. The function CF is the ratio of emitted peak intensity from a layer of atoms located at a given depth in a solid
A new method for non-destructive quantitative analysis of surface nanostructures was developed in recent years. It relies on analysis of the XPS peak shape and usually the e โ ects of elastic electron scattering are neglected in practical applications of the method. In the present paper we study the
We examine substrate/overlayer experiments and the equations commonly used to quantify overlayer thicknesses. Comparisons with accurate Monte-Carlo simulations show that using attenuation lengths (rather than inelastic mean free paths) eliminates most of the error due to elastic scattering without i