๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Theory of elastic and inelastic scattering of electrons emitted from solids: Energy spectra and depth profiling in XPS/AES

โœ Scribed by Arne L. Tofterup


Publisher
Elsevier Science
Year
1986
Weight
59 KB
Volume
167
Category
Article
ISSN
0167-2584

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Evaluation of validity of the depth-depe
โœ Jablonski, A.; Tougaard, S. ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 361 KB ๐Ÿ‘ 2 views

Elastic electron scattering in XPS and AES vary considerably with depth of origin of emitted electrons. To account for this, we introduced in a recent paper a simple correction factor CF. The function CF is the ratio of emitted peak intensity from a layer of atoms located at a given depth in a solid

Elastic Scattering Corrections in AES an
โœ Cumpson, P. J. ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 504 KB

Quantitative Auger electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS) depend on an accurate knowledge of the correct depth scale of emission of the signal electrons. This depends on both inelastic and elastic scattering processes occurring in the specimen under analysis. A previ