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Mapping of zinc content in Cd1−xZnxTe by optical methods

✍ Scribed by P. Horodyský; J. Franc; R. Grill; P. Hlídek; P. Moravec; J. Bok; P. Höschl

Book ID
107453798
Publisher
Springer US
Year
2006
Tongue
English
Weight
200 KB
Volume
35
Category
Article
ISSN
0361-5235

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Optical Constants of Polycrystalline Cd1
Optical Constants of Polycrystalline Cd1−xZnxTe Thin Films by Spectroscopic Ellipsometry
✍ K. Prasada Rao; O. Md. Hussain; B. Srinivasulu Naidu; P. Jayarama Reddy 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 127 KB 👁 2 views

Spectroscopic ellipsometry has been used to determine the optical constants-complex dielectric constant (e\* = e 1 + e 2 ), refractive index (n), extinction coefficient (k), absorption coefficient (a) and normal incidence reflectivity (R)-of two-source vacuum-evaporated polycrystalline Cd 1 Àx Zn x